• DocumentCode
    118290
  • Title

    The finite element analysis of solder joints under temperature cycling

  • Author

    Fangyi Liu ; Wenzhong Lou ; Fufu Wang ; Xuran Ding ; Dakui Wang

  • Author_Institution
    Sch. of Mechatronical Eng., Beijing Inst. of Technol., Beijing, China
  • fYear
    2014
  • fDate
    12-15 Aug. 2014
  • Firstpage
    214
  • Lastpage
    218
  • Abstract
    A thermal-mechanical coupled finite element analysis model of solder joints is established, which plays a role in mechanical support and electrical connection in flip chip. Periodic temperature cycle load (-45°C~125°C) applied on the solder joints and it will generate periodic internal stress and strain in the process of the temperature cycling. With repeat using, the solder joints will produce deformation, and then cracks, extension, interlayer delaminating. The failure of the solder joints may cause the failure of the entire switch. This paper aims to simulate the periodic changes in temperature and obtain the reliability and potential failure modes of solder joints under temperature cycling, thus providing theory reference for the design and application of the novel solid MEMS switch.
  • Keywords
    failure analysis; finite element analysis; flip-chip devices; microswitches; solders; MEMS switch; electrical connection; failure modes; flip chip; periodic internal stress; solder joints failure; temperature cycling; thermal-mechanical coupled finite element analysis model; Analytical models; Finite element analysis; Flip-chip devices; Soldering; Strain; Stress; Thermal stresses; FEM; delamination; flip-chip; solder joint; temperature cycling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
  • Conference_Location
    Chengdu
  • Type

    conf

  • DOI
    10.1109/ICEPT.2014.6922639
  • Filename
    6922639