DocumentCode
118290
Title
The finite element analysis of solder joints under temperature cycling
Author
Fangyi Liu ; Wenzhong Lou ; Fufu Wang ; Xuran Ding ; Dakui Wang
Author_Institution
Sch. of Mechatronical Eng., Beijing Inst. of Technol., Beijing, China
fYear
2014
fDate
12-15 Aug. 2014
Firstpage
214
Lastpage
218
Abstract
A thermal-mechanical coupled finite element analysis model of solder joints is established, which plays a role in mechanical support and electrical connection in flip chip. Periodic temperature cycle load (-45°C~125°C) applied on the solder joints and it will generate periodic internal stress and strain in the process of the temperature cycling. With repeat using, the solder joints will produce deformation, and then cracks, extension, interlayer delaminating. The failure of the solder joints may cause the failure of the entire switch. This paper aims to simulate the periodic changes in temperature and obtain the reliability and potential failure modes of solder joints under temperature cycling, thus providing theory reference for the design and application of the novel solid MEMS switch.
Keywords
failure analysis; finite element analysis; flip-chip devices; microswitches; solders; MEMS switch; electrical connection; failure modes; flip chip; periodic internal stress; solder joints failure; temperature cycling; thermal-mechanical coupled finite element analysis model; Analytical models; Finite element analysis; Flip-chip devices; Soldering; Strain; Stress; Thermal stresses; FEM; delamination; flip-chip; solder joint; temperature cycling;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
Conference_Location
Chengdu
Type
conf
DOI
10.1109/ICEPT.2014.6922639
Filename
6922639
Link To Document