• DocumentCode
    1182922
  • Title

    Elucidation of the emission red-shift with increasing growth temperature of MBE-grown GaInNAs/GaAs quantum wells

  • Author

    Pavelescu, E.-M. ; Dumitrescu, M. ; Jouhti, T. ; Wagner, J. ; Klar, P.J. ; Karirinne, S. ; Pessa, M.

  • Author_Institution
    Optoelectronics Res. Centre, Tampere Univ. of Technol., Finland
  • Volume
    151
  • Issue
    5
  • fYear
    2004
  • Firstpage
    293
  • Lastpage
    296
  • Abstract
    The causes were investigated for the photoluminescence red-shift with increasing quantum well growth temperature (TQW) reported in GaInNAs/GaAs quantum wells grown by molecular-beam epitaxy (Tournie´ et al., 2002; Chauveau et al., 2003). The phenomenon was found to be due to self-annealing, which occurred during the growth of layers on top of the quantum well at typical substrate temperatures TQW for GaAs growth by molecular-beam epitaxy. This self-annealing induces a blue-shift of the quantum well emission, whose magnitude increases as TQW decreases. The TQW-dependent blue-shift is correlated with the presence of In and occurs without noticeable changes in macroscopic alloy composition or quantum well structure. The underlying cause for the increase in blue-shift with decreasing TQW during self-annealing appears to be an increased number of In-N bonds due to point-defect-assisted diffusion. Possible defects involved are discussed in the paper on a qualitative basis.
  • Keywords
    III-V semiconductors; annealing; bonds (chemical); diffusion; gallium arsenide; gallium compounds; indium compounds; molecular beam epitaxial growth; photoluminescence; point defects; red shift; semiconductor growth; semiconductor quantum wells; GaAs growth; GaInNAs-GaAs; GalnNAs/GaAs quantum wells; In-N bonds; MBE-grown quantum wells; blue-shift; emission red-shift; increasing growth temperature; macroscopic alloy composition; molecular-beam epitaxy; photoluminescence; point-defect-assisted diffusion; quantum well emission; self-annealing;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2433
  • Type

    jour

  • DOI
    10.1049/ip-opt:20040880
  • Filename
    1367371