DocumentCode :
1182977
Title :
Blue shift in InGaAsN/GaAs quantum wells with different width
Author :
Peng, C.S. ; Konttinen, J. ; Liu, H.F. ; Pessa, M.
Author_Institution :
Optoelectronics Res. Centre, Tampere Univ. of Technol., Finland
Volume :
151
Issue :
5
fYear :
2004
Firstpage :
317
Lastpage :
319
Abstract :
Three InGaAsN/GaAs QWs with well widths of 3, 5 and 9 nm were grown in one single sample with a GaAs barrier width of 35 nm under the same growth conditions. Post-growth rapid thermal annealing (RTA) was applied at 700°C on this sample and photoluminescence (PL) was measured after different RTA times. It was observed that the blue shifts (BS) were the same, up to ∼15 meV in the first 30 s, for all three QWs; after this the BS of the 9-nm QW saturated very soon at 24 meV and the BSs of 5-nm and 3-nm QWs were saturated much more slowly at more than 45 meV and 57 meV, respectively. There are at least two factors that affect the BS: interdiffusion and short-range order (SRO). SRO is started and saturated much faster than interdiffusion during annealing.
Keywords :
III-V semiconductors; chemical interdiffusion; gallium arsenide; gallium compounds; indium compounds; photoluminescence; rapid thermal annealing; semiconductor growth; semiconductor quantum wells; short-range order; spectral line shift; 15 meV; 24 meV; 3 nm; 30 s; 35 nm; 5 nm; 700 degC; 9 nm; GaAs barrier; InGaAsN-GaAs; InGaAsN/GaAs quantum wells; blue shift; interdiffusion; photoluminescence; post-growth rapid thermal annealing; short-range order;
fLanguage :
English
Journal_Title :
Optoelectronics, IEE Proceedings -
Publisher :
iet
ISSN :
1350-2433
Type :
jour
DOI :
10.1049/ip-opt:20040882
Filename :
1367377
Link To Document :
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