• DocumentCode
    1183003
  • Title

    Dynamic nonlinear networks: State-of-the-art

  • Author

    Chua, Leon O.

  • Volume
    27
  • Issue
    11
  • fYear
    1980
  • fDate
    11/1/1980 12:00:00 AM
  • Firstpage
    1059
  • Lastpage
    1087
  • Abstract
    This paper surveys the state-of-the-art of the qualitative aspects of nonlinear RLC networks. The class of networks being surveyed may contain multi-terminal and multi-port RESISTORS, INDUCTORS, AND CAPACITORS, as well as dc and time-dependent voltage and current sources. The concepts of impasse points and local solvability are introduced and shown to be of fundamental importance in modeling a physical network. Simple criteria are given which guarantee the existence of a global state equation. General theorems are presented for identifying or testing whether a dynamic nonlinear network possesses one or more of the following basic qualitative properties: 1. No finite-forward-escape-time solutions. 2. Local asymptotic stability of equilibrium points and observability of operating points. 3. Eventual uniform-boundedness of solutions. 4. Complete stability and global asymptotic stability. 5. Existence of a dc or periodic steady-state solution. 6. Unique steady-state response and spectrum conservation. The hypotheses of most of these theorems are couched in graph- and circuit-theoretic terms so they can be easily checked, often by inspection. Special efforts are made to state the concepts and results in a form that can be easily understood and used by the nonspecialist. Moreover, each concept and property is profusely illustrated with carefully conceived examples, and intuitive explanations so as to make this paper both motivating and somewhat self-contained. Extensive references are provided to facilitate researchers interested in conducting future research on the many unsolved problems in dynamic nonlinear networks.
  • Keywords
    Nonlinear circuit theory; Nonlinear networks; RLC networks; Asymptotic stability; Capacitors; Circuit stability; Inductors; Nonlinear equations; Observability; Resistors; Steady-state; Testing; Voltage;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-4094
  • Type

    jour

  • DOI
    10.1109/TCS.1980.1084745
  • Filename
    1084745