Title :
Optical properties of GaAsNSe/GaAs superlattice investigated by means of piezoelectric photothermal spectroscopy for nonradiative electron transitions
Author :
Sakai, K. ; Fukushima, S. ; Fukuyama, A. ; Uesugi, K. ; Suemune, I. ; Ikari, T.
Author_Institution :
Frontier Sci. Res. Center, Univ. of Miyazaki, Japan
Abstract :
Optical properties of the GaAsNSe/GaAs superlattice (SL) were investigated using piezoelectric photothermal (PPT) and photoluminescence (PL) spectroscopies. The sample was grown by metalorganic molecular beam epitaxy on a semi-insulating (SI-)GaAs substrate. The SL consists of five periods of GaAsNSe and GaAs layers of thickness 11 nm. The temperature variation of the PPT spectrum of this sample was measured down to liquid nitrogen temperature and three peaks were observed at 0.7, 0.90 and 1.25 eV at 80 K. The 1.25 eV peak seems to be due to the bandgap transition of GaAsNSe. Comparing the PPT spectra with the PL results, it was considered that the localised levels caused the PPT signal peaks at 0.7 and 0.90 eV. The intensity of the 0.90 eV peak drastically changed with secondary light illumination. The effect of the electron nonradiative recombination at the interface states should be considered.
Keywords :
III-V semiconductors; electron-hole recombination; energy gap; gallium arsenide; gallium compounds; interface states; molecular beam epitaxial growth; nonradiative transitions; photoluminescence; photothermal effects; piezoelectricity; semiconductor growth; semiconductor superlattices; 0.7 eV; 0.90 eV; 1.25 eV; 80 K; GaAs; GaAsNSe-GaAs; GaAsNSe/GaAs superlattice; bandgap transition; electron nonradiative recombination; interface states; liquid nitrogen temperature; localised levels; metalorganic molecular beam epitaxy; nonradiative electron transitions; optical properties; photoluminescence spectroscopy; piezoelectric photothermal spectroscopy; secondary light illumination; semiinsulating GaAs substrate;
Journal_Title :
Optoelectronics, IEE Proceedings -
DOI :
10.1049/ip-opt:20040869