• DocumentCode
    1183371
  • Title

    Discrete-time models for statistically self-similar signals

  • Author

    Lee, Seungsin ; Zhao, Wei ; Narasimha, Rajesh ; Rao, Raghuveer M.

  • Author_Institution
    Center for Imaging Sci., Rochester Inst. of Technol., NY, USA
  • Volume
    51
  • Issue
    5
  • fYear
    2003
  • fDate
    5/1/2003 12:00:00 AM
  • Firstpage
    1221
  • Lastpage
    1230
  • Abstract
    Wide-sense statistical self-similarity in continuous-time random processes is defined through invariance of its first-order and second-order statistics to scaling in time. Since scaling has an unambiguous definition in continuous-time but not in discrete-time, researchers have provided various definitions of discrete-time self-similarity without reference to scaling. This paper proposes a discrete-time continuous-dilation scaling operator and develops a framework based on it for formulating statistical self-similarity from first principles in a manner analogous to the continuous-time development. Relationship between the resulting model and fractional order transfer function systems is presented. The potential for using this model in applications involving long-range dependent phenomena is explored.
  • Keywords
    discrete time systems; fractals; mathematical operators; random processes; signal processing; statistical analysis; communication system traffic; continuous-time random processes; discrete-time continuous-dilation scaling operator; discrete-time models; discrete-time self-similarity; first-order statistics; fractional order transfer function systems; long-range dependent phenomena; second-order statistics; statistical self-similarity; statistically self-similar signals; wide-sense statistical self-similarity; Brownian motion; Discrete wavelet transforms; Gaussian noise; Large scale integration; Random processes; Signal processing; Statistics; Traffic control; Transfer functions; White noise;
  • fLanguage
    English
  • Journal_Title
    Signal Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1053-587X
  • Type

    jour

  • DOI
    10.1109/TSP.2003.810281
  • Filename
    1194412