DocumentCode :
1183426
Title :
Failure distributions for local vs. global and replicate vs. standby redundancies
Author :
Kilmer, William L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Massachusetts Univ., Amherst, MA, USA
Volume :
43
Issue :
3
fYear :
1994
fDate :
9/1/1994 12:00:00 AM
Firstpage :
476
Abstract :
The paper begins with an arbitrary single-output, discrete-signal, irredundant system consisting of interconnected computing units each of which has the same exponential distribution for failure time. Then it presents several corresponding redundant designs that compute the same function, derives their distributions for failure time, and illustrates them with quantitative examples. None of the straight replicative designs very much improves the original distribution for failure time; nor do the releasing designs do better. The standby designs do best, even after the standby management-system failure distribution is factored into the system failure distribution. Replicate releasing designs, as a group, are better than straight replicate designs; and standby designs are best
Keywords :
design engineering; failure analysis; fault tolerant computing; probability; redundancy; reliability; computer design; exponential distribution; failure distribution; failure time; interconnected computing units; replicative designs; single-output discrete-signal irredundant system; standby designs; standby management system; Distributed computing; Exponential distribution; Hardware; History; Humans; Logic; Neural networks; Redundancy; State-space methods; System performance;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.326446
Filename :
326446
Link To Document :
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