DocumentCode :
1183490
Title :
Comparison of type-I and type-II accelerated life tests for selecting the most reliable product
Author :
Tseng, Sheng-Tsaing ; Hsu, Chin-Hsiung
Author_Institution :
Dept. of Ind. Manage., Nat. Taiwan Inst. of Technol., Taipei, Taiwan
Volume :
43
Issue :
3
fYear :
1994
fDate :
9/1/1994 12:00:00 AM
Firstpage :
503
Lastpage :
510
Abstract :
In product research and development, one might wish to select the most reliable of several highly-reliable competing products. Both type-I and type-II accelerated life tests (ALT) are well-known to estimate and compare the life of highly reliable (nonrepairable) products within a reasonable testing time. A common decision problem is to choose the better plan for achieving the above goal. This paper proposes an intuitive selection rule for each ALT plan, and then derives the respective optimal ALT sampling plan when the acceleration factor (AF) is known and unknown. Finally, some criteria of Mackay are used to compare the two plans. From a practical point of view, the type-II ALT sampling plan is more convenient, and needs smaller sample size than the type-I ALT sampling plan. Nevertheless, the latter has shorter mean duration time and life testing time than the former
Keywords :
failure analysis; life testing; probability; quality control; reliability; accelerated life tests; acceleration factor; decision problem; duration time; intuitive selection rule; product reliability; quality; sampling plan; type-I; type-II; Acceleration; Life estimation; Life testing; Maximum likelihood estimation; Performance evaluation; Probability; Reliability theory; Sampling methods; Stress; Weibull distribution;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.326454
Filename :
326454
Link To Document :
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