• DocumentCode
    1183490
  • Title

    Comparison of type-I and type-II accelerated life tests for selecting the most reliable product

  • Author

    Tseng, Sheng-Tsaing ; Hsu, Chin-Hsiung

  • Author_Institution
    Dept. of Ind. Manage., Nat. Taiwan Inst. of Technol., Taipei, Taiwan
  • Volume
    43
  • Issue
    3
  • fYear
    1994
  • fDate
    9/1/1994 12:00:00 AM
  • Firstpage
    503
  • Lastpage
    510
  • Abstract
    In product research and development, one might wish to select the most reliable of several highly-reliable competing products. Both type-I and type-II accelerated life tests (ALT) are well-known to estimate and compare the life of highly reliable (nonrepairable) products within a reasonable testing time. A common decision problem is to choose the better plan for achieving the above goal. This paper proposes an intuitive selection rule for each ALT plan, and then derives the respective optimal ALT sampling plan when the acceleration factor (AF) is known and unknown. Finally, some criteria of Mackay are used to compare the two plans. From a practical point of view, the type-II ALT sampling plan is more convenient, and needs smaller sample size than the type-I ALT sampling plan. Nevertheless, the latter has shorter mean duration time and life testing time than the former
  • Keywords
    failure analysis; life testing; probability; quality control; reliability; accelerated life tests; acceleration factor; decision problem; duration time; intuitive selection rule; product reliability; quality; sampling plan; type-I; type-II; Acceleration; Life estimation; Life testing; Maximum likelihood estimation; Performance evaluation; Probability; Reliability theory; Sampling methods; Stress; Weibull distribution;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.326454
  • Filename
    326454