DocumentCode :
118368
Title :
Preparation and evaluation of embedded capacitors with high permittivity BT/ER composites by graft modified method
Author :
Maobai Lai ; Shuhui Yu ; Wenhu Yang ; Rong Sun
Author_Institution :
Shenzhen Inst. of Adv. Technol. Chinese Acad. of Sci., Shenzhen Univ. Town, Shenzhen, China
fYear :
2014
fDate :
12-15 Aug. 2014
Firstpage :
388
Lastpage :
390
Abstract :
Dielectric materials with high-K, low loss and high breakdown voltage are of great importance for a broad range of applications in modern electronics and electrical power systems. In this work, embedded capacitors were fabricated with BT/ER composites as the dielectric layer. The composites were modified with Cr Acac which reacted with epoxy matrix. The addition of PEG and Cr Acac enhanced the permittivity. The embedded capacitor samples showed higher capacitance density. The breakdown voltages, thermal stability, and moisture absorption of the samples were also measured and evaluated. The results indicated that these properties reached the industry requirement and the composites were suitable for the industrial application.
Keywords :
capacitors; composite materials; electric breakdown; high-k dielectric thin films; permittivity; thermal stability; Cr Acac; PEG; capacitance density; dielectric layer; dielectric materials; electrical power systems; embedded capacitors; epoxy matrix; graft modified method; high-k breakdown voltage; industry requirement; modern electronics; moisture absorption; permittivity BT-ER composites; thermal stability; Capacitors; Erbium; Materials; Moisture; Permittivity; Thermal stability; BT/ER composites; dielectric properties; embedded capacitors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
Conference_Location :
Chengdu
Type :
conf
DOI :
10.1109/ICEPT.2014.6922679
Filename :
6922679
Link To Document :
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