• DocumentCode
    1183915
  • Title

    Diffusion-related implications for langasite resonator operation

  • Author

    Schulz, Michal ; Fritze, Holger ; Tuller, Harry L. ; Seh, Huankiat

  • Author_Institution
    Dept. of Phys. Metall. & Mater. Sci., Technische Univ. Clausthal, Germany
  • Volume
    51
  • Issue
    11
  • fYear
    2004
  • Firstpage
    1381
  • Lastpage
    1387
  • Abstract
    Oxygen and gallium diffusiveness in langasite were experimentally determined by analysis of diffusion profiles of /sup 18/O and /sup 71/Ga tracers by SIMS analysis as functions of temperature and doping. Strontium-enhanced diffusiveness and activation energies of /spl sim/1.2/spl plusmn/ 0.2 eV confirm the predominant role of oxygen vacancies in controlling the electrical conductivity of langasite at elevated temperature and oxygen partial pressure. The potential impact of high levels of porosity and the use of an oxygen primary ion beam on the accuracy of some of the data is discussed. The gallium diffusivity, with activation energy of 3.13 eV, was found to be more than two orders of magnitude lower than that of oxygen. Surface exchange measurements enabled estimation of gallium loss at elevated temperatures and oxygen partial pressure; the level is not believed to be of major concern for resonator performance.
  • Keywords
    crystal resonators; doping profiles; electrical conductivity; gallium compounds; ion beam effects; lanthanum compounds; porosity; porous materials; secondary ion mass spectra; self-diffusion; strontium; vacancies (crystal); La/sub 3/Ga/sub 5/SiO/sub 14/; SIMS analysis; activation energy; diffusion profiles; doping; electrical conductivity; elevated temperature; gallium diffusion; gallium loss; ion beam effect; langasite resonator operation; oxygen diffusion; oxygen partial pressure; oxygen vacancies; porosity; potential impact; strontium-enhanced diffusion; surface exchange measurements; Conductivity; Doping profiles; Gallium; Ion beams; Loss measurement; Oxygen; Pressure control; Pressure measurement; Strontium compounds; Temperature control;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2004.1367476
  • Filename
    1367476