• DocumentCode
    118393
  • Title

    The reversible transformation between Cu2(In, Sn) and Cu(In, Sn)2 compounds during solid-state aging

  • Author

    Zhi-Quan Liu ; Fei-Fei Tian

  • Author_Institution
    Inst. of Metal Res., Shenyang Nat. Lab. for Mater. Sci., Shenyang, China
  • fYear
    2014
  • fDate
    12-15 Aug. 2014
  • Firstpage
    425
  • Lastpage
    428
  • Abstract
    In this study, phase transformations at the interfaces between two nearly mutually insoluble elementary substances, In-48Sn solder and Cu, were investigated during serial solid-state aging process. The reversible phase transformation between Cu2(In, Sn) and Cu(In, Sn)2 compounds were observed, which are extremely rare to occur in one and the same system. The corresponding interfacial reactions were discussed according to physicochemical approach in detail. It was concluded that the diffusion ability of Cu and In, Sn atoms dominated different transformations at different temperatures. When the diffusion ability of In/Sn atoms is stronger than that of Cu, Cu2(In, Sn) transforms into Cu(In, Sn)2, while when the diffusion ability of Cu atoms is stronger than that of In/Sn, Cu(In, Sn)2 transforms into Cu2(In, Sn). The diffusion coefficients of Cu and In atoms at different temperatures on Cu substrate can be estimated by the growth kinetics of the compound layers.
  • Keywords
    copper alloys; diffusion; indium alloys; phase transformations; reaction kinetics; solders; tin alloys; Cu(InSn)2; Cu2(InSn); compound layers; diffusion ability; diffusion coefficients; growth kinetics; interfacial reactions; mutually insoluble elementary substances; physicochemical approach; reversible phase transformation; serial solid-state aging process; Aging; Chemicals; Compounds; Substrates; Tin; Transforms; In-48Sn solder; Interfacial reaction; Intermetallic compound; Phase transformation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
  • Conference_Location
    Chengdu
  • Type

    conf

  • DOI
    10.1109/ICEPT.2014.6922688
  • Filename
    6922688