• DocumentCode
    1183991
  • Title

    Calculation and experimental verification of the acoustic stress at GHz frequencies in SAW resonators

  • Author

    Kubat, Franz ; Ruile, Werner ; Hesjedal, Thorsten ; Stotz, James ; Rösler, Ulrike ; Reindl, Leonhard M.

  • Author_Institution
    EPCOS AG, Munich, Germany
  • Volume
    51
  • Issue
    11
  • fYear
    2004
  • Firstpage
    1437
  • Lastpage
    1448
  • Abstract
    High power applications of surface acoustic wave (SAW) devices may lead to acoustomigration in their thin metal electrodes, which deteriorates the performance or may even destroy the SAW device. It is confirmed in this paper that the mechanism of acoustomigration is caused by the SAW-induced stress in the metal. The quantitative calculation of this stress are shown in detail, starting from the widely used P-Matrix model as a standard analysis tool. The combination with the partial wave method (PWM) yields the stress distribution inside the metal. This approach provides the flexibility to determine the stresses for any given point in a SAW device, for any input power, frequency, wavetype, device geometry, or metal layer. In order to confirm the absolute values of the stress components, we calculated and measured displacements as a function of input power and frequency.
  • Keywords
    finite element analysis; internal stresses; surface acoustic wave resonators; P-matrix model; SAW devices; SAW resonators; SAW-induced stress; acoustic stress; acoustomigration; deteriorates; device geometry; flexibility; partial wave method; quantitative calculation; standard analysis tool; stress distribution; surface acoustic wave devices; thin metal electrodes; Acoustic devices; Acoustic waves; Electrodes; Geometry; Power measurement; Pulse width modulation; Resonant frequency; Stress; Surface acoustic wave devices; Surface acoustic waves;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/TUFFC.2004.1367484
  • Filename
    1367484