• DocumentCode
    1184215
  • Title

    Null Detector Circuit Design Scheme for Detecting Defective AC-Coupled Capacitors in Differential Signaling

  • Author

    Baeg, Sanghyeon

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Hanyang Univ., Ansan, South Korea
  • Volume
    58
  • Issue
    8
  • fYear
    2009
  • Firstpage
    2544
  • Lastpage
    2556
  • Abstract
    This paper presents a novel method for detecting defective ac-coupling capacitors in high-speed differential signaling connections by designing a circuit with null detectors at the differential receiver. The design parameters of selecting the null ranges in the receiver buffer are proposed to efficiently detect the voltage droop that creates erroneous jitter. The null detectors in the proposed method enable the use of a lower test signal speed than the mission data rate at differential connections to detect defective capacitors. The proposed design method of null detectors combines four design and test factors, namely, regular null, voltage doubling, fail-safe, and defect sensitization, to determine the stretched null used for test purposes. The null-detection scheme has been implemented and verified in the design using a regular current-mode logic (CML) differential buffer in the 0.18- mum complementary metal-oxide-semiconductor (CMOS) process. The detection capability of the proposed method to check for traditional defects with the same null detector is also demonstrated through SPICE-based fault simulations. The proposed method is also verified with the board developed for parameter measurements. The parameters proposed in this paper showed excellent agreement among calculated, simulated, and measured values. In particular, measured parameters showed strong closeness up to 99% to its calculated values.
  • Keywords
    CMOS integrated circuits; SPICE; capacitors; coupled circuits; current-mode logic; detector circuits; CMOS process; SPICE-based fault simulations; complementary metal-oxide-semiconductor process; current-mode logic; defect sensitization; defective ac-coupled capacitors; differential buffer; differential receiver; differential signaling; erroneous jitter; fail-safe; null detector circuit design scheme; receiver buffer; regular null; voltage doubling; voltage droop; Capacitor; differential signaling; fault; pattern-dependent jitter (PDJ); test buffer;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2009.2014624
  • Filename
    4797825