Title :
Buried-oxide silicon-on-insulator structures. II. Waveguide grating couplers
Author :
Emmons, Robert M. ; Hall, Dennis G.
Author_Institution :
Inst. of Opt., Rochester Univ., NY, USA
fDate :
1/1/1992 12:00:00 AM
Abstract :
For pt.I, see ibid., vol.28, no.1, p.157-63 (1992). Grating couplers formed in buried-oxide silicon-on-insulator structures are analyzed using both a convergent Block wave approach and a simple approximate method. Strong interface reflections that occur during grating coupling can cause interference effects which result in variations in coupling efficiency and coupling length by an order of magnitude when varying grating period and film thickness parameters. Results indicate that proper coupler design is essential in order to obtain efficient coupling
Keywords :
approximation theory; diffraction gratings; integrated optics; optical couplers; optical waveguide theory; SIMOX process; approximate method; buried-oxide silicon-on-insulator structures; convergent Block wave approach; coupler design; coupling efficiency; coupling length; efficient coupling; film thickness; grating coupling; grating period; interface reflections; interference effects; waveguide grating couplers; Couplers; Diffraction gratings; Gallium arsenide; Geometry; Insulation; Interference; Optical films; Optical reflection; Optical waveguides; Silicon on insulator technology;
Journal_Title :
Quantum Electronics, IEEE Journal of
