• DocumentCode
    1184370
  • Title

    Yield maximization and worst-case design with arbitrary statistical distributions

  • Author

    Brayton, Robert K. ; Director, Stephen W. ; Hachtel, Gary D.

  • Volume
    27
  • Issue
    9
  • fYear
    1980
  • fDate
    9/1/1980 12:00:00 AM
  • Firstpage
    756
  • Lastpage
    764
  • Abstract
    We describe a method by which a variety of statistical design problems can be solved by a linear program. We describe three key aspects of this approach. 1) The correspondence between the level contours of a given probability density function and a particular norm, which we shall call a pdf-norm. 2) The expression of distance in this norm from a given set of hyperplanes in terms of the dual of the pdf-norm. 3) The use of a linear program to inscribe a maximal pdf-norm-body into a simplicial approximation to the feasible region of a given statistical design problem. This work thus extends the applicability of a previously published algorithm, to the case of arbitrary pdf-norms and consequently to a wide variety of statistical design problems including the common mixed worstcase-yield maximization problem.
  • Keywords
    Computer-aided circuit analysis and design; Network synthesis; Network tolerance assignment; Electronic circuits; Fluctuations; Gaussian distribution; Integrated circuit yield; Linear programming; Manufacturing processes; Power supplies; Probability density function; Statistical distributions; Voltage;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-4094
  • Type

    jour

  • DOI
    10.1109/TCS.1980.1084889
  • Filename
    1084889