• DocumentCode
    1184756
  • Title

    Design of testable structures defined by simple loops

  • Author

    Abraham, Jacob A. ; Gajski, Daniel D.

  • Volume
    28
  • Issue
    11
  • fYear
    1981
  • fDate
    11/1/1981 12:00:00 AM
  • Firstpage
    1079
  • Lastpage
    1088
  • Abstract
    A methodology is given for generating combinational structures from high-level descriptions (using assignment statements, "if\´ statements, and single-nested loops) of register-transfer (RT) level operators. The generated structures are cellular, and are interconnected in a tree structure. A general algorithm is given to test cellular tree structures with a test length which grows only linearly with the size of the tree. It is proved that this test length is optimal to within a constant factor. Ways of making the structures self-checking are also indicated.
  • Keywords
    Cellular logic; Combinational circuit testing; Digital circuits; Algorithm design and analysis; Computational modeling; Design automation; Design methodology; Design optimization; Hardware; Process design; Testing; Tree data structures; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-4094
  • Type

    jour

  • DOI
    10.1109/TCS.1981.1084931
  • Filename
    1084931