DocumentCode
1185089
Title
Tomographic Imaging of Surface Deformation From Scarce Measurements via Sinogram Recovery
Author
Constantino, Eugenio P A ; Ozanyan, Krikor B.
Author_Institution
Univ. of Manchester, Manchester
Volume
9
Issue
4
fYear
2009
fDate
4/1/2009 12:00:00 AM
Firstpage
399
Lastpage
410
Abstract
Imaging from limited data is a common practice in many industrial tomography applications where sensor design often assumes an irregular approach with low number of measurements. In this paper, we propose a novel algorithm that reduces the task of hard-field imaging from incomplete data to a sinogram recovery problem. The algorithm utilises a novel angular interpolation scheme, employing the sinusoidal Hough transform, to identify sinusoidal traces in the sinogram and estimate missing sinogram samples along such traces. Together with the detailed theory behind the algorithm, we present its performance with experimental data obtained from a photonic guided path tomography system. The targeted subject function is the induced deformation in the quasi-planar surface of a flexible ~1 m2 sensor, fixed to an underlying soft-foam mat. The set of 32 independent measurements generated by the system are presented in a severely sparse 91times180 sinogram image. The sinogram is then recovered to a degree suitable for standard tomographic algorithms for hard-field data inversion, such as filtered back-projection.
Keywords
Hough transforms; computer vision; computerised tomography; interpolation; production engineering computing; angular interpolation scheme; photonic guided path tomography system; quasiplanar surface; scarce measurements; sinogram recovery; sinusoidal Hough transform; surface deformation; tomographic imaging; Algorithm design and analysis; Data visualization; Image reconstruction; Image sensors; Interpolation; Iterative algorithms; Monitoring; Optoelectronic and photonic sensors; Sensor systems; Single photon emission computed tomography; Hard-field tomography; Hough transform; sinogram recovery; sparse-angle tomography;
fLanguage
English
Journal_Title
Sensors Journal, IEEE
Publisher
ieee
ISSN
1530-437X
Type
jour
DOI
10.1109/JSEN.2008.2012195
Filename
4797910
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