• DocumentCode
    1185176
  • Title

    Er:YAG three-micron laser: performances and limits

  • Author

    Georgescu, Serban ; Toma, Octavian

  • Author_Institution
    Nat. Inst. for Lasers, Inst. of Atomic Phys., Bucharest, Romania
  • Volume
    11
  • Issue
    3
  • fYear
    2005
  • Firstpage
    682
  • Lastpage
    689
  • Abstract
    Mathematical modeling is used to estimate the performances of the three-micron Er:YAG laser in various generation regimes. The model, based on simple rate equations, uses exclusively spectroscopic data and includes upconversion from both initial (4I112/) and terminal (4I132/) levels as well as the cross-relaxation from the pump level (4S32/). Despite the unfavorable ratio between the lifetimes of the laser levels, the recirculation of the excitation on the metastable levels produced by the effective energy transfer processes at high erbium concentrations leads to rather high emission efficiency in the continuous wave (CW) regime. In contrast, in the Q-switch regime, the energy transfer processes are practically frozen during the giant pulse generation and the access to the stored energy is limited. In this paper, simple analytical expressions for emission efficiency in CW and Q-switch regimes are presented. Due to the growing interest in short laser pulses for medical applications, we discuss in more detail the Q-switch regime (pump conditions, co-doping, etc.).
  • Keywords
    Q-switching; erbium; laser transitions; metastable states; optical pulse generation; optical pumping; solid lasers; 3 micron; Er:YAG three-micron laser; Q-switch; Y3Al5O12:Er; cross-relaxation; effective energy transfer; emission efficiency; laser level lifetimes; metastable level; pulse generation; upconversion; Energy exchange; Equations; Erbium; Laser excitation; Laser modes; Mathematical model; Metastasis; Pulse generation; Pump lasers; Spectroscopy; CW lasers; YAG; erbium; pulsed lasers; solid lasers;
  • fLanguage
    English
  • Journal_Title
    Selected Topics in Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    1077-260X
  • Type

    jour

  • DOI
    10.1109/JSTQE.2005.850593
  • Filename
    1516136