• DocumentCode
    1185230
  • Title

    Linearization techniques for nth-order sensor models in MOS VLSI technology

  • Author

    Khachab, Nabil I. ; Ismail, Mohammed

  • Author_Institution
    Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
  • Volume
    38
  • Issue
    12
  • fYear
    1991
  • fDate
    12/1/1991 12:00:00 AM
  • Firstpage
    1439
  • Lastpage
    1450
  • Abstract
    The authors present new linearization techniques and introduce novel circuits for second- and third-order sensor models. Furthermore, a general framework as well as circuit techniques for linearization of sensor models of any order are presented. The new techniques are based on subtle circuit design of simple and compact multiplier/divider and vector multiplier circuits that comprise op-amps and MOS transistors. The design is programmable using DC control voltages and is capable of implementing different values of model parameters using identically sized devices without altering physical circuit layout. The resulting continuous-time signal processing circuits are completely compatible with MOS VLSI technology and easy to incorporate in a computer-aided design environment. The circuit design details are given and nonideal effects due to op-amp dynamics and MOS parasitic capacitances are investigated. Experimental results for the new second-order sensor models, obtained from a MOSIS 2-μm CMOS process test chip, and SPICE simulation results of third-order models verify the validity of the proposed linearization techniques
  • Keywords
    MOS integrated circuits; VLSI; dividing circuits; electric sensing devices; multiplying circuits; CMOS process test chip; DC control voltages; MOS VLSI technology; MOS parasitic capacitances; SPICE simulation; continuous-time signal processing circuits; linearization techniques; model parameters; multiplier/divider; nth-order sensor models; op-amp dynamics; vector multiplier circuits; CMOS technology; Circuit synthesis; Linearization techniques; MOSFETs; Operational amplifiers; Semiconductor device modeling; Signal processing; Size control; Very large scale integration; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-4094
  • Type

    jour

  • DOI
    10.1109/31.108498
  • Filename
    108498