• DocumentCode
    1185543
  • Title

    Measurement of phase error distributions in silica-based arrayed-waveguide grating multiplexers by using Fourier transform spectroscopy

  • Author

    Takada, Kazumasa ; Inoue, Yasuyuki ; Yamada, Hiroyoshi ; Horiguchi, M.

  • Author_Institution
    NTT Opto-Electron. Labs., Ibaraki
  • Volume
    30
  • Issue
    20
  • fYear
    1994
  • fDate
    9/29/1994 12:00:00 AM
  • Firstpage
    1671
  • Lastpage
    1672
  • Abstract
    The phase errors caused by deviations in the designed lengths of the optical paths in silica-based arrayed-waveguide grating (AWG) multiplexers were measured using Fourier transform spectroscopy. The measurement accuracy was ±1°. The phase errors in an AWG multiplexer with a channel spacing of 10 GHz and a channel crosstalk of -15 dB were randomly distributed between -122 and 90°
  • Keywords
    Fourier transform spectra; diffraction gratings; errors; integrated optics; multiplexing equipment; optical waveguides; Fourier transform spectroscopy; SiO2; channel crosstalk; channel spacing; optical path lengths; phase error distributions; silica-based arrayed-waveguide grating multiplexers;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19941113
  • Filename
    328486
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1185543