• DocumentCode
    1185557
  • Title

    Built-in dynamic current sensor circuit for digital VLSI CMOS testing

  • Author

    Segura, Jaume ; Roca, M. ; Mateo, D. ; Rubio, Albert

  • Author_Institution
    Dept. of Phys., Balearic Islands Univ., Palma de Mallorca
  • Volume
    30
  • Issue
    20
  • fYear
    1994
  • fDate
    9/29/1994 12:00:00 AM
  • Firstpage
    1668
  • Lastpage
    1669
  • Abstract
    IDDQ testing is a powerful strategy for detecting defects that do not alter the logic behaviour of CMOS ICs. Such a technique is very effective especially in the detection of bridging defects although some open defects can be also detected. However, an important set of open defects escapes quiescent power supply current testing because they prevent any current elevation. As a solution, dynamic current testing is investigated. A built-in dynamic current sensor is proposed
  • Keywords
    CMOS integrated circuits; VLSI; built-in self test; electric sensing devices; integrated circuit testing; integrated logic circuits; logic testing; bridging defects; built-in dynamic current sensor circuit; defect detection; digital VLSI CMOS testing; logic behaviour; open defects;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19941168
  • Filename
    328488
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1185557