• DocumentCode
    1185739
  • Title

    Novel fabrication of micromechanical oscillators with nanoscale sensitivity at room temperature

  • Author

    Chabot, Michelle D. ; Moreland, John M. ; Gao, Lan ; Liou, Sy-Hwang ; Miller, Casey W.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • Volume
    14
  • Issue
    5
  • fYear
    2005
  • Firstpage
    1118
  • Lastpage
    1126
  • Abstract
    In this paper, we report on the design, fabrication, and implementation of ultrasensitive micromechanical oscillators. Our ultrathin single-crystal silicon cantilevers with integrated magnetic structures are the first of their kind: They are fabricated using a novel high-yield process in which magnetic film patterning and deposition are combined with cantilever fabrication. These novel devices have been developed for use as cantilever magnetometers and as force sensors in nuclear magnetic resonance force microscopy (MRFM). These two applications have achieved nanometer-scale resolution using the cantilevers described in this work. Current magnetic moment sensitivity achieved for the devices, when used as magnetometers, is 10-15 J/T at room temperature, which is more than a 1000-fold improvement in sensitivity, compared to conventional magnetometers. Current room temperature force sensitivity of MRFM cantilevers is ∼10-16 N/√Hz, which is comparable to the room temperature sensitivities of similar devices of its type. Finite element modeling was used to improve design parameters, ensure that the devices meet experimental demands, and correlate mode shape with observed results. The photolithographic fabrication process was optimized, yielding an average of ∼85% and alignment better than 1 μm. Postfabrication-focused ion-beam milling was used to further pattern the integrated magnetic structures when nanometer scale dimensions were required.
  • Keywords
    cantilevers; finite element analysis; magnetic force microscopy; magnetometers; micromechanical devices; oscillators; sensitivity; MRFM; cantilever magnetometers; finite element modeling; force sensors; integrated magnetic structures; magnetic film patterning; magnetometry; micromechanical oscillators; nanoscale sensitivity; nuclear magnetic resonance force microscopy; postfabrication-focused ion-beam milling; ultrathin single-crystal silicon cantilevers; Fabrication; Force sensors; Magnetic films; Magnetic force microscopy; Magnetic resonance; Magnetometers; Micromechanical devices; Oscillators; Silicon; Temperature sensors; Cantilevers; fabrication; magnetic resonance force microscopy (MRFM); magnetometry;
  • fLanguage
    English
  • Journal_Title
    Microelectromechanical Systems, Journal of
  • Publisher
    ieee
  • ISSN
    1057-7157
  • Type

    jour

  • DOI
    10.1109/JMEMS.2005.851869
  • Filename
    1516194