Title :
Size-Dependent Strain Relaxation and Optical Characteristics of InGaN/GaN Nanorod LEDs
Author :
Wu, Yuh-Renn ; Chiu, Chinghua ; Cheng-Yu Chang ; Yu, Peichen ; Kuo, Hao-Chung
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
In this paper, InGaN/GaN nanorod LEDs with various sizes are fabricated using self-assembled Ni nanomasks and inductively coupled plasma-reactive ion etching. Photoluminescence (PL) characteristics exhibit size-dependent, wavelength blue shifts of the emission spectra from the nanorod LEDs. Numerical analyses using a valence force field model and a self-consistent Poisson, Schrodinger, and drift-diffusion solver quantitatively describe the correlation between the wavelength blue shifts and the strain relaxation of multiple quantum wells embedded in nanorods with different averaged sizes. Time-resolved PL studies confirm that the array with a smaller size exhibits a shorter carrier lifetime at low temperature, giving rise to a stronger PL intensity. However, the PL intensity deteriorates at room temperature, compared to that of a larger size, possibly due to an increased number of surface states, which decreases the nonradiative lifetime, and hence reduces the internal quantum efficiency.
Keywords :
III-V semiconductors; Poisson equation; Schrodinger equation; carrier lifetime; gallium compounds; indium compounds; light emitting diodes; masks; nanofabrication; nanophotonics; nanostructured materials; photoluminescence; quantum wells; self-assembly; spectral line shift; sputter etching; time resolved spectra; wide band gap semiconductors; InGaN-GaN; Schrodinger solver; blue shift; carrier lifetime; drift-diffusion solver; inductively coupled plasma-reactive ion etching; nanorod LED optical characteristics; photoluminescence; quantum well; self-assembled nickel nanomask; self-consistent Poisson solver; size-dependent strain relaxation; temperature 293 K to 298 K; time-resolved PL; valence force field model; LEDs; nanotechnology;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/JSTQE.2009.2015583