Title :
Band faults: Efficient approximations to fault bands for the simulation before fault diagnosis of linear circuits
Author :
Pahwa, Anil ; Rohrer, Ronald A.
fDate :
2/1/1982 12:00:00 AM
Abstract :
"Band faults," the approximate movements of nominal worstcase boundaries with catastropic faults, are much more efficiently computed than the "fault bands" that they approximate. Derived from a simulation before test, band faults can be used to create a fault dictionary that is supposed to isolate single element catastrophic faults. By no means general, the approach when applied to several example linear circuits nonetheless has yielded promising results.
Keywords :
Analog system testing; Computer-aided circuit analysis and design; Linear circuits, time-invariant; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer aided software engineering; Dictionaries; Fault diagnosis; Laboratories; Linear circuits; Physics;
Journal_Title :
Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCS.1982.1085114