• DocumentCode
    1186686
  • Title

    InSb Quantum-Well-Based Micro-Hall Devices: Potential for pT Detectivity

  • Author

    Kunets, Vasyl P. ; Easwaran, Saptharishi ; Black, William T. ; Guzun, Dorel ; Mazur, Yuriy I. ; Goel, Niti ; Mishima, Tetsuya D. ; Santos, Michael B. ; Salamo, Gregory J.

  • Author_Institution
    Dept. of Phys., Univ. of Arkansas, Fayetteville, AR
  • Volume
    56
  • Issue
    4
  • fYear
    2009
  • fDate
    4/1/2009 12:00:00 AM
  • Firstpage
    683
  • Lastpage
    687
  • Abstract
    A series of high-mobility Al0.12In0.88Sb/InSb heterostructures were grown by molecular beam epitaxy to investigate the fabrication of micro-Hall magnetic field sensors. By applying remote delta-doping of different densities to control the 2-D electron density in the quantum channel, as well as scattering mechanisms, the detection limit of the micro-Hall device was improved. The present studies show that micro-Hall devices 35 mum wide have the ability to detect a magnetic field of 25 nT at 300 K and 11 nT at 80 K operating at a frequency of 10 kHz. Our results indicate that the use of devices with larger sizes, based on the same material system, will lead to magnetic field detection in the pT range at low temperatures and sub-nT range even at room temperature.
  • Keywords
    Hall effect devices; III-V semiconductors; aluminium compounds; indium compounds; magnetic sensors; molecular beam epitaxial growth; semiconductor quantum wells; 2-D electron density; Al0.12In0.88Sb-InSb; micro-Hall magnetic field sensors; molecular beam epitaxy; quantum-well-based micro-Hall devices; remote delta-doping; temperature 300 K; temperature 80 K; Electrons; Fabrication; Frequency; Magnetic fields; Magnetic materials; Magnetic sensors; Molecular beam epitaxial growth; Particle scattering; Quantum well devices; Temperature distribution; $hbox{In}_{0.12}hbox{Al}_{0.88}hbox{Sb}$; InSb; magnetic sensitivity; micro-Hall effect devices; narrow band gap semiconductor material; noise; quantum well;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2009.2014187
  • Filename
    4798213