DocumentCode
11869
Title
Leakage, Area, and Headroom Tradeoffs for Scattered Relative Temperature Sensor Front-End Architectures
Author
Vosooghi, Bozorgmehr ; Li Lu ; Changzhi Li
Author_Institution
Dept. of Electr. & Comput. Eng., Texas Tech Univ., Lubbock, TX, USA
Volume
61
Issue
2
fYear
2014
fDate
Feb. 2014
Firstpage
80
Lastpage
84
Abstract
In this brief, several interface structures between sensor nodes and the core, including a tree multiplexer (MUX), a row-column selection MUX, and a tree-column selection MUX, are investigated for a scattered temperature sensor. The occupied area, leakage current, measurement error, and headroom have been studied. It is shown that different structures significantly differ on performance. Tradeoffs among leakage current, area, and headroom for each structure are studied and analyzed in detail. A design guide for various performance requirements is provided. It is shown that leakage current can be significantly reduced by the tree MUX. The minimum area and headroom consumption can be achieved by the row-column selection MUX. The proposed tree-column selection MUX can trade the accuracy for headroom and area overhead.
Keywords
analogue-digital conversion; integrated circuit design; integrated circuit packaging; leakage currents; microprocessor chips; temperature sensors; thermal management (packaging); front end architectures; headroom issue; leakage current; measurement error; occupied area; row-column selection multiplexer; scattered relative temperature sensor; scattered temperature sensor; sensor nodes; tree-column selection; Decoding; Leakage currents; Logic gates; MOSFET; Routing; Temperature sensors; Area; headroom; leakage current; multiplexer (MUX); sensor nodes;
fLanguage
English
Journal_Title
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher
ieee
ISSN
1549-7747
Type
jour
DOI
10.1109/TCSII.2013.2291095
Filename
6678758
Link To Document