DocumentCode
1187078
Title
Statistical Significance of Test Methods for Low Probability Breakdown and Withstand Voltages
Author
Trinh, N Giao ; Vincent, Claire
Author_Institution
Institut de recherche de 1´´ Hydro-Québec
Issue
2
fYear
1980
fDate
3/1/1980 12:00:00 AM
Firstpage
711
Lastpage
719
Abstract
A systematic evaluation of the statistical significance of different test methods currently used for the determination of the breakdown and withstand voltages was made. The breakdown probability of the test voltages was evaluated by both direct calculation and computer simulation of the test methods, assuming a known intrinsic breakdown probability in a single voltage application (or one cycle ac). The latter was assumed to be of either normal, smallest values or Weibull type, and to be unaffected by the event occurring in the pre- ceding voltage applications (or ac cycles).
Keywords
Application software; Breakdown voltage; Computer simulation; Electric breakdown; Flashover; Impulse testing; Probability distribution; Statistical analysis; System testing; Voltage measurement;
fLanguage
English
Journal_Title
Power Apparatus and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0018-9510
Type
jour
DOI
10.1109/TPAS.1980.319664
Filename
4113856
Link To Document