DocumentCode :
1187078
Title :
Statistical Significance of Test Methods for Low Probability Breakdown and Withstand Voltages
Author :
Trinh, N Giao ; Vincent, Claire
Author_Institution :
Institut de recherche de 1´´ Hydro-Québec
Issue :
2
fYear :
1980
fDate :
3/1/1980 12:00:00 AM
Firstpage :
711
Lastpage :
719
Abstract :
A systematic evaluation of the statistical significance of different test methods currently used for the determination of the breakdown and withstand voltages was made. The breakdown probability of the test voltages was evaluated by both direct calculation and computer simulation of the test methods, assuming a known intrinsic breakdown probability in a single voltage application (or one cycle ac). The latter was assumed to be of either normal, smallest values or Weibull type, and to be unaffected by the event occurring in the pre- ceding voltage applications (or ac cycles).
Keywords :
Application software; Breakdown voltage; Computer simulation; Electric breakdown; Flashover; Impulse testing; Probability distribution; Statistical analysis; System testing; Voltage measurement;
fLanguage :
English
Journal_Title :
Power Apparatus and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9510
Type :
jour
DOI :
10.1109/TPAS.1980.319664
Filename :
4113856
Link To Document :
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