• DocumentCode
    1187078
  • Title

    Statistical Significance of Test Methods for Low Probability Breakdown and Withstand Voltages

  • Author

    Trinh, N Giao ; Vincent, Claire

  • Author_Institution
    Institut de recherche de 1´´ Hydro-Québec
  • Issue
    2
  • fYear
    1980
  • fDate
    3/1/1980 12:00:00 AM
  • Firstpage
    711
  • Lastpage
    719
  • Abstract
    A systematic evaluation of the statistical significance of different test methods currently used for the determination of the breakdown and withstand voltages was made. The breakdown probability of the test voltages was evaluated by both direct calculation and computer simulation of the test methods, assuming a known intrinsic breakdown probability in a single voltage application (or one cycle ac). The latter was assumed to be of either normal, smallest values or Weibull type, and to be unaffected by the event occurring in the pre- ceding voltage applications (or ac cycles).
  • Keywords
    Application software; Breakdown voltage; Computer simulation; Electric breakdown; Flashover; Impulse testing; Probability distribution; Statistical analysis; System testing; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Power Apparatus and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9510
  • Type

    jour

  • DOI
    10.1109/TPAS.1980.319664
  • Filename
    4113856