DocumentCode :
118719
Title :
The study of interficial reaction during rapidly solidified lead-free solder Sn3.5Ag0.7Cu/Cu laser soldering
Author :
Jiahui Liu ; Haitao Ma ; Shuang Li ; Junhao Sun ; Kunwar, Alaknanda ; Wang Miao ; Jianjie Hao ; Yanpeng Bao
Author_Institution :
Sch. of Mater. Sci. & Eng., Dalian Univ. of Technol., Dalian, China
fYear :
2014
fDate :
12-15 Aug. 2014
Firstpage :
949
Lastpage :
952
Abstract :
Interfacial intermetallic compound (IMC) is a necessary condition for the reliability of solder connection. In this study, the fiber lasers were used to solder rapidly-solidified lead-free solder Sn3.5Ag0.7Cu and Cu substrate, investigating the influence of laser soldering process parameters on the growth of IMC at the solid/liquid interface and finding the optimum parameters of laser soldering process. To simulate the IMC growth under actual service conditions, the solder joints under the condition p=50w, v=140mm/min were chosen to age at 150°C. Scanning electron microscopy (SEM) and EDS were used to observe IMCs morphology and analyze the composition of IMCs. The results showed that when the laser power was 50w, the thickness of IMCs formed at the interface decreased with the increase of scanning speed. And the morphology of IMCs also changed with the scanning speed. In the aging process, the thickness of the IMCs increased with the aging time, and the morphology became relatively flat. In addition, the thickness of IMCs at the rapidly-solidified Sn3.5Ag0.7Cu/Cu, which was thicker before the aging process, was thinner than that at the as-cast Sn3.5Ag0.7Cu/Cu in the subsequent aging process. The distribution of Ag3Sn particles formed in the rapidly-solidified lead-free solders was more uniform, which suppressed the growth of Cu6Sn5 in the aging process better.
Keywords :
copper alloys; reliability; scanning electron microscopy; silver alloys; soldering; tin alloys; Ag3Sn; EDS; IMC growth; SEM; Sn3.5Ag0.7Cu-Cu; actual service conditions; aging time; interfacial intermetallic compound; interfacial reaction; laser soldering process parameters; liquid interface; morphology; rapidly-solidified lead-free solders; scanning electron microscopy; scanning speed; solder connection reliability; solid interface; Aging; Lead; Morphology; Power generation; Power lasers; Soldering; Solid lasers; Aging; IMCs; laser soldering; rapidly-solidified Sn3.5Ag0.7Cu;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
Conference_Location :
Chengdu
Type :
conf
DOI :
10.1109/ICEPT.2014.6922804
Filename :
6922804
Link To Document :
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