DocumentCode :
1187247
Title :
A quantum correction based on Schrodinger equation applied to Monte Carlo device simulation
Author :
Winstead, Brian ; Ravaioli, Umberto
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Illinois, Urbana, IL, USA
Volume :
50
Issue :
2
fYear :
2003
Firstpage :
440
Lastpage :
446
Abstract :
A full-band Monte Carlo model has been coupled to a Schrodinger equation solver to account for the size quantization effects that occur at heterojunctions, such as the oxide interface in MOS devices. The overall model retains the features of the well-developed semi-classical approach, by treating self-consistently the Schrodinger solution as a correction to the particle-based Monte Carlo. The simulator has been benchmarked by comparing results for MOS capacitors and double gate structures with a self-consistent quantum solution, showing that the proposed approach is efficient and accurate. This quantum correction methodology is extended to device simulation, by accounting for the interplay between confinement and transport through a parameter which we call "transverse" temperature. This approach appears to be valid even for nanometer-scale devices in which nonequilibrium ballistic transport is occurring. We present simulations of a 25-nm MOSFET and compare results obtained with and without the quantum correction.
Keywords :
MOS capacitors; MOSFET; Monte Carlo methods; Schrodinger equation; nanoelectronics; semiconductor device models; semiconductor-insulator boundaries; simulation; 25 nm; MOS capacitors; MOS devices; MOSFET; Monte Carlo device simulation; Schrodinger equation solver; double gate structures; full-band Monte Carlo model; heterojunctions; nanometer-scale devices; nonequilibrium ballistic transport; oxide interface; particle-based Monte Carlo; quantum correction methodology; size quantization effects; Ballistic transport; Heterojunctions; MOS capacitors; MOS devices; MOSFET circuits; Monte Carlo methods; Nanoscale devices; Quantization; Schrodinger equation; Temperature;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2003.809431
Filename :
1196089
Link To Document :
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