Abstract :
A new approach to testing based on boundary scan is discussed. This technique gives access to individual chip pins by including a little standardized circuitry and a test access port (TAP) on every IC. Boundary scan basics are reviewed, and three principal types of tests that can be performed with the boundary-scan register are described. They are: interconnect tests, using the EXTEST (external test) instruction; chip tests, using the INTEST instruction; and sampling, using the SAMPLE instruction.<>
Keywords :
automatic testing; integrated circuit testing; EXTEST instruction; IC; INTEST instruction; SAMPLE instruction; boundary scan; chip tests; interconnect tests; sampling; test access port; Automatic testing; Circuit testing; Costs; Integrated circuit testing; Logic testing; Manufacturing automation; Pins; Standards development; System testing; Test equipment;
