DocumentCode :
118741
Title :
Formation of single phase Cu-Sn IMCs via layer-by-layer electroplating of Cu and Sn metals
Author :
Rong An ; Huiwen Ma ; Hailong Li ; Zhen Zheng ; Chunqing Wang
Author_Institution :
Key Lab. of Micro-Syst. & Micro-Struct. Manuf., Harbin Inst. of Technol., Harbin, China
fYear :
2014
fDate :
12-15 Aug. 2014
Firstpage :
980
Lastpage :
984
Abstract :
The intermetallic compounds, Cu6Sn5 and Cu3Sn, have been prepared via layer-by-layer and single-layer electroplating with subsequent annealing. The two preparation methods were compared in terms of annealing temperature and time, different electroplating effect, and film thickness. Moreover, two copper plates were joined together to form a full-IMC (Cu6Sn5 and Cu3Sn) joint. The shear mechanical property of the IMCs was studied by stretching the plates under different rates. Finally, it was found that the average shear strength of the IMC joints was up to 0.84 MPa when the thickness of the IMC was less than 3 μm. Fracture analysis indicates that the Cu6Sn5 lead to cleavage fracture while the Cu3Sn shows typical intergranular fracture.
Keywords :
annealing; brittle fracture; copper; electronics packaging; electroplating; fracture; shear strength; tin; Cu3Sn; Cu6Sn5; IMC thickness; annealing temperature; annealing time; average shear strength; cleavage fracture; copper metal; copper plates; electronic packages; electroplating effect; film thickness; fracture analysis; full-IMC joint; intergranular fracture; intermetallic compounds; layer-by-layer electroplating; plate stretching; preparation method; shear mechanical property; single-layer electroplating; single-phase copper-tin IMC formation; subsequent annealing; tin metal; Annealing; Compounds; Copper; Intermetallic; Mechanical factors; Nonhomogeneous media; Tin; Cu-Sn intermetallics; layer-by-layer electroplating; mechanical property;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
Conference_Location :
Chengdu
Type :
conf
DOI :
10.1109/ICEPT.2014.6922811
Filename :
6922811
Link To Document :
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