• DocumentCode
    118741
  • Title

    Formation of single phase Cu-Sn IMCs via layer-by-layer electroplating of Cu and Sn metals

  • Author

    Rong An ; Huiwen Ma ; Hailong Li ; Zhen Zheng ; Chunqing Wang

  • Author_Institution
    Key Lab. of Micro-Syst. & Micro-Struct. Manuf., Harbin Inst. of Technol., Harbin, China
  • fYear
    2014
  • fDate
    12-15 Aug. 2014
  • Firstpage
    980
  • Lastpage
    984
  • Abstract
    The intermetallic compounds, Cu6Sn5 and Cu3Sn, have been prepared via layer-by-layer and single-layer electroplating with subsequent annealing. The two preparation methods were compared in terms of annealing temperature and time, different electroplating effect, and film thickness. Moreover, two copper plates were joined together to form a full-IMC (Cu6Sn5 and Cu3Sn) joint. The shear mechanical property of the IMCs was studied by stretching the plates under different rates. Finally, it was found that the average shear strength of the IMC joints was up to 0.84 MPa when the thickness of the IMC was less than 3 μm. Fracture analysis indicates that the Cu6Sn5 lead to cleavage fracture while the Cu3Sn shows typical intergranular fracture.
  • Keywords
    annealing; brittle fracture; copper; electronics packaging; electroplating; fracture; shear strength; tin; Cu3Sn; Cu6Sn5; IMC thickness; annealing temperature; annealing time; average shear strength; cleavage fracture; copper metal; copper plates; electronic packages; electroplating effect; film thickness; fracture analysis; full-IMC joint; intergranular fracture; intermetallic compounds; layer-by-layer electroplating; plate stretching; preparation method; shear mechanical property; single-layer electroplating; single-phase copper-tin IMC formation; subsequent annealing; tin metal; Annealing; Compounds; Copper; Intermetallic; Mechanical factors; Nonhomogeneous media; Tin; Cu-Sn intermetallics; layer-by-layer electroplating; mechanical property;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
  • Conference_Location
    Chengdu
  • Type

    conf

  • DOI
    10.1109/ICEPT.2014.6922811
  • Filename
    6922811