• DocumentCode
    1187488
  • Title

    Microlithography: trends, challenges, solutions, and their impact on design

  • Author

    Wong, Alfred K.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Hong Kong Univ., China
  • Volume
    23
  • Issue
    2
  • fYear
    2003
  • Firstpage
    12
  • Lastpage
    21
  • Abstract
    With lithography parameters approaching their limits, continuous improvement requires increasing dialogues and compromises between the technology and design communities. Only with such communication can semiconductor manufacturers reach the 30 nm physical-gate-length era with optical lithography. Optical lithography is an enabling technology for transistor miniaturization. With the wavelength and numerical aperture of exposure systems approaching their limits, the semiconductor industry needs continuous reduction of the k1 factor. Challenges include image quality improvement, proximity effect correction, and cost control. An indispensable ingredient for future success is improvement in the design-manufacture interface.
  • Keywords
    integrated circuit manufacture; integrated circuit technology; photolithography; reticles; 30 micron; IC technology; Rayleigh criterion; optical lithography; photomask; reticle; semiconductor industry; wavelength reduction; Circuits; Costs; Electron optics; Lenses; Light sources; Lithography; Optical attenuators; Optical filters; Particle beam optics; Production;
  • fLanguage
    English
  • Journal_Title
    Micro, IEEE
  • Publisher
    ieee
  • ISSN
    0272-1732
  • Type

    jour

  • DOI
    10.1109/MM.2003.1196111
  • Filename
    1196111