DocumentCode :
1187488
Title :
Microlithography: trends, challenges, solutions, and their impact on design
Author :
Wong, Alfred K.
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ., China
Volume :
23
Issue :
2
fYear :
2003
Firstpage :
12
Lastpage :
21
Abstract :
With lithography parameters approaching their limits, continuous improvement requires increasing dialogues and compromises between the technology and design communities. Only with such communication can semiconductor manufacturers reach the 30 nm physical-gate-length era with optical lithography. Optical lithography is an enabling technology for transistor miniaturization. With the wavelength and numerical aperture of exposure systems approaching their limits, the semiconductor industry needs continuous reduction of the k1 factor. Challenges include image quality improvement, proximity effect correction, and cost control. An indispensable ingredient for future success is improvement in the design-manufacture interface.
Keywords :
integrated circuit manufacture; integrated circuit technology; photolithography; reticles; 30 micron; IC technology; Rayleigh criterion; optical lithography; photomask; reticle; semiconductor industry; wavelength reduction; Circuits; Costs; Electron optics; Lenses; Light sources; Lithography; Optical attenuators; Optical filters; Particle beam optics; Production;
fLanguage :
English
Journal_Title :
Micro, IEEE
Publisher :
ieee
ISSN :
0272-1732
Type :
jour
DOI :
10.1109/MM.2003.1196111
Filename :
1196111
Link To Document :
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