DocumentCode
1187488
Title
Microlithography: trends, challenges, solutions, and their impact on design
Author
Wong, Alfred K.
Author_Institution
Dept. of Electr. & Electron. Eng., Hong Kong Univ., China
Volume
23
Issue
2
fYear
2003
Firstpage
12
Lastpage
21
Abstract
With lithography parameters approaching their limits, continuous improvement requires increasing dialogues and compromises between the technology and design communities. Only with such communication can semiconductor manufacturers reach the 30 nm physical-gate-length era with optical lithography. Optical lithography is an enabling technology for transistor miniaturization. With the wavelength and numerical aperture of exposure systems approaching their limits, the semiconductor industry needs continuous reduction of the k1 factor. Challenges include image quality improvement, proximity effect correction, and cost control. An indispensable ingredient for future success is improvement in the design-manufacture interface.
Keywords
integrated circuit manufacture; integrated circuit technology; photolithography; reticles; 30 micron; IC technology; Rayleigh criterion; optical lithography; photomask; reticle; semiconductor industry; wavelength reduction; Circuits; Costs; Electron optics; Lenses; Light sources; Lithography; Optical attenuators; Optical filters; Particle beam optics; Production;
fLanguage
English
Journal_Title
Micro, IEEE
Publisher
ieee
ISSN
0272-1732
Type
jour
DOI
10.1109/MM.2003.1196111
Filename
1196111
Link To Document