DocumentCode :
1187677
Title :
An absorber tip diffraction coefficient
Author :
Joseph, Philip J. ; Tyson, Albert D. ; Burnside, Walter D.
Author_Institution :
Dedicated Electronics Inc., Chester, NH, USA
Volume :
36
Issue :
4
fYear :
1994
fDate :
11/1/1994 12:00:00 AM
Firstpage :
372
Lastpage :
379
Abstract :
The UTD corner diffraction solution for a perfectly conducting corner is empirically modified for the case of a dielectric corner. The dielectric may be lossless or lossy, but is assumed to be homogeneous. This modified solution is used to calculate the bistatic scattering from the tip of a dielectric pyramid. Sample calculations display some features of the scattering from a single lossy dielectric pyramid. To verify the solution, calculations are compared with backscatter measurements of a single pyramid that is cut from a homogeneous lossless dielectric (polyethylene). Calculations are then compared with measurements for the more pertinent case of bistatic scattering from a wall of pyramidal radar absorbing material
Keywords :
backscatter; dielectric properties; electromagnetic wave diffraction; electromagnetic wave scattering; geometrical theory of diffraction; UTD corner diffraction solution; absorber tip diffraction coefficient; backscatter measurements; bistatic scattering; dielectric corner; homogeneous dielectric; lossless dielectric; lossy dielectric pyramid; perfectly conducting corner; polyethylene; pyramidal radar absorbing material; Backscatter; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Diffraction; Displays; Loss measurement; Polyethylene; Radar measurements; Radar scattering;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/15.328869
Filename :
328869
Link To Document :
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