Title :
Predictions Based on Maximum Oscillator Frequency
Author :
Drouilhet, P.R., Jr.
fDate :
6/1/1955 12:00:00 AM
Abstract :
Considerable difficulty is encountered in directly measuring the parameters of a transistor at very high frequencies. An approximate high-frequency equivalent circuit for a transistor is presented, and several techniques for measuring the alpha-cutoff frequency are discussed. An indirect technique is presented involving the measurement of the maximum frequency at which the transistor can oscillate, and it is shown that this leads to a simple and accurate determination of the alpha-cutoff frequency. This maximum frequency of oscillation can also be used to predict the approximate gain obtainable from a transistor at high frequencies, and the efficiency which may be realized from the transistor used as a high frequency oscillator.
Keywords :
1955 IRE-AIEE Conference transistor circuit papers; Capacitance; Delay effects; Equations; Equivalent circuits; Frequency measurement; Monitoring; Particle measurements; Resistors; Voltage; Voltage-controlled oscillators;
Journal_Title :
Circuit Theory, IRE Transactions on
DOI :
10.1109/TCT.1955.1085219