Title :
Reliability of 1206 capacitor/SAC305 solder joint reflowed in protective atmosphere
Author :
Yeqing Tao ; Dongyan Ding ; Ting Li ; GUO, Jun ; He, Tian ; Yunhong Yu
Author_Institution :
Sch. of Mater. Sci. & Eng., Shanghai Jiao Tong Univ., Shanghai, China
Abstract :
Electronic assembly technology is in the transition from traditional tin-lead to lead-free. In comparison with Sn-Pb solders, high melting point and poor wettability of the lead-free solders lead to great challenge in many aspects. It has been accepted that inert N2 atmosphere can improve the wettability and reliablity of solder joints. The focus of this study is to investigate the reliability of 1206 capacitor/SAC305 solder joint reflowed in N2 atmosphere with dilute oxygen. Reflow process in N2 atmospheres with dilute oxygen was conducted for OSP-pad PCBs. The wetting behavior during reflow was in-situ observed with SMT microscope. Visual inspection through optical microscope and microstructural characterization of the solder joints after both reflow process and environmental tests were carried out. The experimental results indicated that N2 atmosphere could obviously improve the wetting performance and reliability of solder joints in comparison with the solder joint fabricated in air atmosphere.
Keywords :
capacitors; printed circuits; reflow soldering; reliability; solders; surface mount technology; wetting; 1206 capacitor-SAC305 solder joint reflow reliability; OSP-pad PCB; SMT microscope; air atmosphere; dilute oxygen; electronic assembly technology; environmental tests; inert nitrogen atmosphere; lead-free solders; melting point; microstructural characterization; nitrogen atmosphere; optical microscope; protective atmosphere; reflow process; solder joint fabrication; solder joint wettability; tin-lead solders; visual inspection; wetting behavior; wetting performance; Atmosphere; Capacitors; Lead; Materials; Reliability; Soldering; Tin; N2 atmosphere; lead-free; reflow; reliability;
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
Conference_Location :
Chengdu
DOI :
10.1109/ICEPT.2014.6922821