DocumentCode
1187850
Title
Bias of mean value and mean square value measurements based on quantized data
Author
Kollár, István
Author_Institution
Dept. of Electr. Eng., Stanford Univ., CA, USA
Volume
43
Issue
5
fYear
1994
fDate
10/1/1994 12:00:00 AM
Firstpage
733
Lastpage
739
Abstract
This paper investigates the imperfect fulfilment of the validity conditions of the noise model quantization. The general expressions of the deviations of the moments from Sheppard´s corrections are derived. Approximate upper and lower bounds of the bias are given for the measurement of first- and second-order moments of sinusoidal, uniformly distributed, and Gaussian signals. It is shown that because of the uncontrollable mean value at the input of the ADC (offset, drift), the worst-case values have to be investigated; it is illustrated how a simple-form envelope function of the errors can be used as an upper bound. Since the worst-case relative positions of the signal and the quantization characteristics are taken into account, the results are valid for both midtread and midrise quantizers, while in the literature results are given for a selected quantizer type only
Keywords
analogue-digital conversion; error analysis; measurement theory; random noise; ADC; Gaussian signals; Sheppard´s corrections; first-order moments; lower bounds; mean square value measurements; mean value; midrise quantizers; midtread quantizers; noise model quantization; quantization characteristics; quantized data; second-order moments; selected quantizer; simple-form envelope function; sine wave; uncontrollable mean value; upper bounds; worst-case relative positions; worst-case values; Additive noise; Convolution; Genetic expression; Instruments; Noise measurement; Probability density function; Quantization; Random variables; Read only memory; Upper bound;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.328894
Filename
328894
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