• DocumentCode
    1187902
  • Title

    Measurements of real ESD threats have been ignored too long

  • Author

    Barth, Jon

  • Volume
    8
  • Issue
    4
  • fYear
    2005
  • Firstpage
    61
  • Lastpage
    63
  • Abstract
    Electrostatic discharge (ESD) protection circuits are built into every pin of an integrated circuit (IC) to protect the core operating circuits. Many different standards groups have assumed the responsibility of producing ESD testing standards for the IC industry. The quality of ESD testing and their standards have suffered from a lack of measurement updates without an effort for periodic investigations of the real threat from ESD. Measurements to determine the real parameters of ESD threat have been ignored for too long. The present tests and standards will continue because organized ESD experts in standards groups are unconcerned with the real threat and can ignore the new data we have measured.
  • Keywords
    electrostatic discharge; integrated circuit measurement; integrated circuit reliability; integrated circuit testing; ESD testing standards; ESD threat; electrostatic discharge protection circuits; integrated circuit measurement; integrated circuit reliability; integrated circuit testing; measurement updates; Circuit testing; Dielectrics; Electrostatic discharge; Fault location; Protection; Pulse circuits; Pulse measurements; Sparks; Time measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Instrumentation & Measurement Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1094-6969
  • Type

    jour

  • DOI
    10.1109/MIM.2005.1518625
  • Filename
    1518625