Title :
Flash memories: the best of two worlds
Author :
Pashley, Richard D. ; Lai, Stefan K.
Author_Institution :
Intel Corp., Folsom, CA, USA
Abstract :
The use of flash memories, which are based on the technology of either erasable programmable ROMs (EPROMs) or electrically erasable programmable ROMs (EEPROMs), as an alternative to both of the latter is discussed. Their properties are compared to those of EPROMs and EEPROMs. Quality and reliability issues are considered. The future of all three memory types is discussed.<>
Keywords :
EPROM; circuit reliability; integrated memory circuits; EEPROMs; EPROMs; electrically erasable programmable ROMs; erasable programmable ROMs; flash memories; quality; reliability; Application software; Application specific integrated circuits; Costs; EPROM; Filling; Flash memory; Paper technology; Random access memory; Read only memory; Semiconductor memory;
Journal_Title :
Spectrum, IEEE
