DocumentCode :
118799
Title :
Reliable system design using decision diagrams in presence of hard and soft errors
Author :
Israr, Amber ; Huss, Sorin A.
Author_Institution :
Electr. Eng. Dept., COMSATS Inst. of Inf. Techonology, Islamabad, Pakistan
fYear :
2014
fDate :
14-18 Jan. 2014
Firstpage :
1
Lastpage :
9
Abstract :
Hard and soft errors are inherently different in property and effect on the functionality of systems. Utilizing this fact, a new reliability model is developed, i.e., “lifetime reliability”, which considers both hard and soft errors occurring in information processing systems. Based on an introduction of System Decision Diagrams a couple of new data structures denoted as System Resource Decision Diagram and System Task Instance Decision Diagram, respectively, are proposed. The first data structure deals with the hard errors occurring in the system, whereas the second one represents the effects soft errors have on the system´s functionality. Together, these data structures help calculate the lifetime reliability of the system they are representing. Both the construction of this diagram pair and the memory-aware evaluation of the reliability based on it are detailed in an algorithmic way. The error model representation and the reliability quantification approach are aimed to be employed in a high-level design process to accelerate exploration of design space. The proposed method is illustrated for a number of benchmarks taken from published papers. The achieved results demonstrate that this novel approach is highly memory efficient and at the same time accurate as compared to previous known schemes.
Keywords :
data structures; decision diagrams; embedded systems; fault tolerant computing; data structures; design space exploration; error model representation; hard errors; high-level design process; information processing systems; lifetime reliability model; memory-aware evaluation; reliability quantification approach; reliable system design; soft errors; system resource decision diagram; system task instance decision diagram; Boolean functions; Data structures; Integrated circuit reliability; Reliability engineering; Tunneling magnetoresistance; Vectors; System Decision Diagrams; embedded system; hard error; reliability evaluation; soft error; system-level design; zero-suppressed decision diagram;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Sciences and Technology (IBCAST), 2014 11th International Bhurban Conference on
Conference_Location :
Islamabad
Type :
conf
DOI :
10.1109/IBCAST.2014.6778136
Filename :
6778136
Link To Document :
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