• DocumentCode
    1188030
  • Title

    Stability and Long Term Degradation of Metal Oxide Surge Arresters

  • Author

    Tominaga, S. ; Shibuya, Y. ; Fujiwara, Y. ; Imataki, M. ; Nitta, T.

  • Author_Institution
    Mitsubishi Electric Corporation
  • Issue
    4
  • fYear
    1980
  • fDate
    7/1/1980 12:00:00 AM
  • Firstpage
    1548
  • Lastpage
    1556
  • Abstract
    The thermal runaway process and the long term degradation of metal oxide blocks for a surge arrester are investigated both experimentally and analytically. The critical condition of a thermal runaway of the blocks is formulated. The dynamic stability after surge absorptions is also studied. The stability limit is given as a function of the temperature rise of the blocks due to the surge absorptions. A kind of degradation of metal oxide proceeds under ac stress even at the level lower than that required for the thermal runaway. The life of a metal oxide surge arrester is evaluated combining the degradation process with the above thermal runaway condition. The Arrhenius relation which has been proposed to evaluate the life of metal oxide blocks is discussed in the light of the analysis.
  • Keywords
    Absorption; Arresters; Current density; Power system protection; Stability; Surge protection; Temperature; Thermal degradation; Thermal stresses; Voltage;
  • fLanguage
    English
  • Journal_Title
    Power Apparatus and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9510
  • Type

    jour

  • DOI
    10.1109/TPAS.1980.319580
  • Filename
    4113963