Title :
Nonlinearity and frequency-path modelling of three-longitudinal-mode nanometric displacement measurement system
Author :
Olyaee, S. ; Nejad, Mohammad S.
Author_Institution :
Dept. of Electr. Eng., Iran Univ. of Sci. & Technol., Tehran
fDate :
10/1/2007 12:00:00 AM
Abstract :
The effects of periodic nonlinearity, intermodulation distortion, phase detection uncertainty and electrical cross-talk in a three-longitudinal-mode laser heterodyne Doppler interferometer (TLMI) displacement measurement system are presented. A frequency-path model consisting of three frequency components and two paths is also designed. As a result, there will be six frequency-path elements and 21 distinct interference terms. The periodic nonlinearity in the TLMI is mathematically modelled and simulated. Simulation results are compared with the typical two-mode heterodyne interferometer to confirm the designed model performance. The authors demonstrate that the nonlinearity of TLMI can be greatly reduced using the same compensation method as used in a two-frequency interferometer proposed by Hou et al.
Keywords :
Doppler measurement; displacement measurement; intermodulation distortion; light interferometers; measurement systems; nanotechnology; electrical cross-talk; frequency components; frequency-path elements; frequency-path model; heterodyne Doppler interferometer; intermodulation distortion; periodic nonlinearity; phase detection uncertainty; three-longitudinal-mode laser interferometer; three-longitudinal-mode nanometric displacement measurement system; two-frequency interferometer; two-mode heterodyne interferometer;
Journal_Title :
Optoelectronics, IET
DOI :
10.1049/iet-opt:20060107