• DocumentCode
    1188107
  • Title

    Low current density, inverted polarity, high-speed, top-emitting 850 nm vertical-cavity surface-emitting lasers

  • Author

    Al-Omari, A.N. ; Lear, K.L.

  • Author_Institution
    Electron. Eng. Dept., Yarmouk Univ., Irbid
  • Volume
    1
  • Issue
    5
  • fYear
    2007
  • fDate
    10/1/2007 12:00:00 AM
  • Firstpage
    221
  • Lastpage
    225
  • Abstract
    High-speed, oxide-confined, inverted polarity (n-up), polyimide-planarised 850 nm vertical-cavity surface-emitting lasers (VCSELs) were fabricated and characterised. The lasers exhibit a -3 dB frequency modulation bandwidth (f3dB) up to 15.2 GHz with a 10 mum oxide aperture diameter, at the lowest current density (/bias) ever reported of 6.4 kA/cm2. The ratio f3dB 2/Jbias = 36.1 (GHz2/kA/cm2) represents a 21% increase when compared with the highest previously reported ratio. The threshold voltage and current were as low as 1.45 V and 0.9 mA, respectively, with a series resistance of 65 Omega. A rate-equation-based thermal VCSEL model was used to predict the device performance at different temperatures. Good agreements between measured and simulated DC characteristics were obtained.
  • Keywords
    current density; frequency modulation; optical modulation; surface emitting lasers; current 0.9 mA; inverted polarity; low current density; rate-equation-based model; resistance 65 ohm; size 10 mum; thermal VCSEL model; threshold voltage; vertical-cavity surface-emitting lasers; voltage 1.45 V; wavelength 850 nm;
  • fLanguage
    English
  • Journal_Title
    Optoelectronics, IET
  • Publisher
    iet
  • ISSN
    1751-8768
  • Type

    jour

  • DOI
    10.1049/iet-opt:20070024
  • Filename
    4312813