DocumentCode :
1188107
Title :
Low current density, inverted polarity, high-speed, top-emitting 850 nm vertical-cavity surface-emitting lasers
Author :
Al-Omari, A.N. ; Lear, K.L.
Author_Institution :
Electron. Eng. Dept., Yarmouk Univ., Irbid
Volume :
1
Issue :
5
fYear :
2007
fDate :
10/1/2007 12:00:00 AM
Firstpage :
221
Lastpage :
225
Abstract :
High-speed, oxide-confined, inverted polarity (n-up), polyimide-planarised 850 nm vertical-cavity surface-emitting lasers (VCSELs) were fabricated and characterised. The lasers exhibit a -3 dB frequency modulation bandwidth (f3dB) up to 15.2 GHz with a 10 mum oxide aperture diameter, at the lowest current density (/bias) ever reported of 6.4 kA/cm2. The ratio f3dB 2/Jbias = 36.1 (GHz2/kA/cm2) represents a 21% increase when compared with the highest previously reported ratio. The threshold voltage and current were as low as 1.45 V and 0.9 mA, respectively, with a series resistance of 65 Omega. A rate-equation-based thermal VCSEL model was used to predict the device performance at different temperatures. Good agreements between measured and simulated DC characteristics were obtained.
Keywords :
current density; frequency modulation; optical modulation; surface emitting lasers; current 0.9 mA; inverted polarity; low current density; rate-equation-based model; resistance 65 ohm; size 10 mum; thermal VCSEL model; threshold voltage; vertical-cavity surface-emitting lasers; voltage 1.45 V; wavelength 850 nm;
fLanguage :
English
Journal_Title :
Optoelectronics, IET
Publisher :
iet
ISSN :
1751-8768
Type :
jour
DOI :
10.1049/iet-opt:20070024
Filename :
4312813
Link To Document :
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