Title :
A wide-band on-wafer noise parameter measurement system at 50-75 GHz
Author :
Kantanen, Mikko ; Lahdes, Manu ; Vähä-Heikkilä, Tauno ; Tuovinen, Jussi
Author_Institution :
Millimeter Wave Lab. of Finland-Millilab, VTT Tech. Res. Centre of Finland, Espoo, Finland
fDate :
5/1/2003 12:00:00 AM
Abstract :
A wide-band on-wafer noise parameter measurement system at 50-75 GHz is presented. This measurement system is based on the cold-source method with a computer-controlled waveguide tuner. Calibrations and measurement methods are discussed and measured results for passive and active on-wafer devices are shown over a 50-75 GHz range. An InP high electron-mobility transistor device is used as a test item for the active device. A Monte Carlo analysis to study measurement uncertainties is also shown. The measurement system is a useful tool in the development and verification of device noise models, as well as in device characterization.
Keywords :
MIMIC; Monte Carlo methods; S-parameters; automatic test equipment; calibration; electric noise measurement; integrated circuit measurement; integrated circuit noise; integrated circuit testing; measurement errors; measurement uncertainty; millimetre wave measurement; semiconductor device noise; tuning; 50 to 75 GHz; ATE; EHF; InP; InP HEMT; MM-wave measurement; Monte Carlo analysis; active on-wafer devices; calibrations; cold-source method; computer-controlled waveguide tuner; device characterization; high electron mobility transistor; measurement uncertainties; noise parameter measurement system; on-wafer noise parameter measurement; passive on-wafer devices; wideband noise parameter measurement; Calibration; HEMTs; Indium phosphide; MODFETs; Measurement uncertainty; Monte Carlo methods; Noise measurement; Testing; Tuners; Wideband;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2003.810129
