DocumentCode
1188395
Title
Write-Once Read-Many-Times Memory Based on a Single Layer of Pentacene
Author
Shi, Shengwei ; Peng, Junbiao ; Lin, Jian ; Ma, Dongge
Author_Institution
Inst. de Phys. et de Chimie des Mater. de Strasbourg, Strasbourg
Volume
30
Issue
4
fYear
2009
fDate
4/1/2009 12:00:00 AM
Firstpage
343
Lastpage
345
Abstract
We realized an organic electrical memory device with a simple structure based on single-layer pentacene film embedded between Al and ITO electrodes. The optimization of the thickness and deposition rate of pentacene resulted in a reliable device with an on/off current ratio as high as nearly 106, which was two orders of magnitude higher than previous results, and the storage time was more than 576 h. The current transition process is attributed to the formation and damage of the interface dipole at different electric fields, in which the current conduction showed a transition from ohmic conductive current to Fowler-Nordheim tunneling current. After the transition from ON- to OFF-state, the device tended to remain in the OFF-state even when the applied voltage was removed, which indicated that the device was very promising for write-once read-many-times memory.
Keywords
electrodes; iodine compounds; storage management chips; tin compounds; Fowler-Nordheim tunneling current; ITO; current transition process; electric field; interface dipole; ohmic conductive current; organic electrical memory device; single-layer pentacene film; write-once read-many-times memory; Interface dipole; on/off ratio; pentacene; reliability; write once read many times (WORM);
fLanguage
English
Journal_Title
Electron Device Letters, IEEE
Publisher
ieee
ISSN
0741-3106
Type
jour
DOI
10.1109/LED.2009.2013976
Filename
4799147
Link To Document