DocumentCode :
1188426
Title :
Semiautomatic Transistor Characteristic-Curve Plotter
Author :
Fischler, H. ; Yerushalmi, S.
Author_Institution :
Department of Electronics, Weizmann Institute of Science, Rehovoth, Israel
Volume :
12
Issue :
1
fYear :
1963
fDate :
6/1/1963 12:00:00 AM
Firstpage :
13
Lastpage :
16
Abstract :
A simple semiautomatic instrument for tracing common-emitter hybrid collector and base characteristics of low-level transistors is described. DC supplies, including a transistorized automatic and continuously varying voltage supply, are encountered in the network which allows appropriate biasing of transistors to be tested. Plotting of transistor curves is provided by a conventional X-Y recorder. The range of the instrument comprises: for plotting collector characteristics¿base currents up to 40 ¿a, collector voltages up to 15 v; for base characteristics¿base currents up to about 30 ¿a. The instrument enables accurate and rapid plotting of transistor characteristics, which is of considerable importance for special design purposes, when trade data of transistors prove to be inadequate.
Keywords :
Automatic testing; Circuit noise; Electrical resistance measurement; Ferrites; Instruments; Low voltage; Noise measurement; Resonance; Tensile stress; Transistors;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1963.4313320
Filename :
4313320
Link To Document :
بازگشت