DocumentCode :
1188477
Title :
Some conditions under which hierarchical verification is O(N)
Author :
Scheffer, Louis K.
Author_Institution :
Cadence Design Syst. Inc., San Jose, CA, USA
Volume :
22
Issue :
5
fYear :
2003
fDate :
5/1/2003 12:00:00 AM
Firstpage :
643
Lastpage :
646
Abstract :
Before manufacturing, each chip design must be inspected for possible errors. For example, design rule checking is used to check for adherence to the physical manufacturing rules, and static timing analysis is used to verify that the design has adequate performance. Although modern chip designs are invariably specified hierarchically, verification algorithms can treat this hierarchy in different ways. The most straightforward way to verify a hierarchical design is to expand (or flatten) the hierarchy, then do the test. Since most verification algorithms involve at least sorting the data, such algorithms are at least O(N log N), where N is the size of the flattened hierarchy. Alternatively, a verification tool can try to use the hierarchy rather than flattening it. One form of hierarchical verification involves verifying each cell, generating a model (also called an abstract) for each cell, and then checking all interactions between cells by using their abstracts. Under some conditions, this may be more efficient than flattening the hierarchy and then verifying. In particular, if the size of the abstract is O(na) for a cell containing n primitives, and the time to verify a cell and generate the abstract is O(nb), then the complete verification of all levels of the hierarchy is O(N), provided ab<1.
Keywords :
circuit CAD; computational geometry; formal verification; hierarchical systems; integrated circuit design; timing; abstract; chip design; complexity; computation time; computational geometry; design automation; design rule checking; flattened hierarchy; hierarchical systems; hierarchical verification; physical manufacturing rules; primitives; static timing analysis; verification algorithms; Abstracts; Algorithm design and analysis; Chip scale packaging; Complexity theory; Design automation; Manufacturing; Performance analysis; Sorting; Testing; Timing;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2003.810740
Filename :
1196207
Link To Document :
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