Title :
Contact resistance investigation of electrical connector with different shrink range
Author :
Ke Duan ; Fulong Zhu ; Ying Li ; Kai Tang ; Sheng Liu ; Yanming Chen
Author_Institution :
Inst. of Microsyst., Huazhong Univ. of Sci. & Technol., Wuhan, China
Abstract :
The reliability of electric connection and a stable contact resistance value is usually the most important thing for electrical connector, especially for the electrical connector used in severe environment such as frequently vibration. The present study has investigated the relationship between shrink range and contact resistance of a kind of electrical connector by using the ANSYS software. A indirect coupled structural thermal electrical method was developed to obtain the relations. This paper gives the maximum stress and contact resistance information of connectors in different shrink range value. The contact temperature also was analyzed in this paper.
Keywords :
contact resistance; electric connectors; reliability; shrinkage; stress analysis; ANSYS software; contact resistance; contact temperature; electrical connector; indirect coupled structural thermal electrical method; maximum stress; reliability; shrink range value; Contact resistance; Reliability; Sockets; Stress; Temperature distribution; Indirect coupled method; contact resistance; electrical connector;
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
Conference_Location :
Chengdu
DOI :
10.1109/ICEPT.2014.6922846