DocumentCode :
118858
Title :
Entropy metric regularization for computational imaging with sensor arrays
Author :
Gurram, Prudhvi ; Rao, Raghuveer
Author_Institution :
MBO Partners Inc., Adelphi, MD, USA
fYear :
2014
fDate :
14-16 Oct. 2014
Firstpage :
1
Lastpage :
8
Abstract :
Correlative interferometric image reconstruction is a computational imaging approach for synthesizing images from sensor arrays and relies on estimating source intensity from the cross-correlation across near-field or far-field measurements from multiple sensors of the arrays. Key to using the approach is the exploitation of relationship between the correlation and the source intensity. This relationship is of a Fourier transform type when the sensors are in the far-field of the source and the velocity of wave propagation in the intervening medium is constant. Often the estimation problem is ill-posed resulting in unrealistic reconstructions of images. Positivity constraints, boundary restrictions, ℓ1 regularization, and sparsity constrained optimization have been applied in previous work. This paper considers the noisy case and formulates the estimation problem as least squares minimization with entropy metrics, either minimum or maximum, as regularization terms. Situations involving far-field interferometric imaging of extended sources are considered and results illustrating the advantages of these entropy metrics and their applicability are provided.
Keywords :
Fourier transforms; correlation methods; electromagnetic wave propagation; image denoising; image reconstruction; least squares approximations; matrix algebra; maximum entropy methods; minimisation; sensor arrays; Fourier transform; computational imaging; correlative interferometric image reconstruction; cross correlation; entropy metric regularization; far field measurement; image synthesis optimization; least square minimization; near field measurement; sensor array; source intensity estimation problem; wave propagation velocity; Correlation; Entropy; Image reconstruction; Imaging; Measurement; Noise; Sensor arrays;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Imagery Pattern Recognition Workshop (AIPR), 2014 IEEE
Conference_Location :
Washington, DC
Type :
conf
DOI :
10.1109/AIPR.2014.7041929
Filename :
7041929
Link To Document :
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