DocumentCode :
118880
Title :
Typical failure mechanism of LED package
Author :
Guangning Xu ; Zeya Peng ; Huanxiang Xu ; Xianjun Kuang ; Lei Zhang
Author_Institution :
Reliability Anal. & Res. Centre, China Electron. Product Reliability & Environ. Testing Inst., Guangzhou, China
fYear :
2014
fDate :
12-15 Aug. 2014
Firstpage :
1194
Lastpage :
1197
Abstract :
Traditional epoxy filled with quartz sand cannot be used as plastic packaging materials of LED, as it is a kind of optoelectronic device. Its plastic packaging materials must be those with high light transmission rate such as epoxy and silicone. But these packaging materials also have the following weak points: big thermal mismatch coefficient with chip and lead frame, poor air tightness, easy to thermal aging or corrosion aging, etc. These weak points would greatly increase the failure rate of LED devices, because of their high heat exchanging efficiency. As expected, during the process of LED device failure analysis, combining with the analysis method of polymer materials, these weak points are proved to be the fundamental reasons of the failure. The failure mechanism including: the electrochemical corrosion of chip and lead frame caused by moisture permeability, chemical corrosion of lead frame and bonding wire and other metallic materials caused by corrosive gas permeation, the corrosion and aging of encapsulant, etc. According to these failure mechanisms, more specific suggestions are offered to increase LED device quality.
Keywords :
ageing; corrosion; encapsulation; failure analysis; lead bonding; light emitting diodes; plastic packaging; polymers; semiconductor device packaging; silicones; LED package; bonding wire; corrosion aging; corrosive gas permeation; electrochemical corrosion; encapsulant; epoxy; failure analysis; heat exchanging efficiency; lead frame; moisture permeability; optoelectronic device; plastic packaging materials; polymer materials; poor air tightness; silicone; thermal aging; thermal mismatch coefficient; typical failure mechanism; Bonding; Corrosion; Encapsulation; Failure analysis; Light emitting diodes; Materials; Moisture; LED; Package; corrosion; encapsulant; failure analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
Conference_Location :
Chengdu
Type :
conf
DOI :
10.1109/ICEPT.2014.6922857
Filename :
6922857
Link To Document :
بازگشت