• DocumentCode
    118880
  • Title

    Typical failure mechanism of LED package

  • Author

    Guangning Xu ; Zeya Peng ; Huanxiang Xu ; Xianjun Kuang ; Lei Zhang

  • Author_Institution
    Reliability Anal. & Res. Centre, China Electron. Product Reliability & Environ. Testing Inst., Guangzhou, China
  • fYear
    2014
  • fDate
    12-15 Aug. 2014
  • Firstpage
    1194
  • Lastpage
    1197
  • Abstract
    Traditional epoxy filled with quartz sand cannot be used as plastic packaging materials of LED, as it is a kind of optoelectronic device. Its plastic packaging materials must be those with high light transmission rate such as epoxy and silicone. But these packaging materials also have the following weak points: big thermal mismatch coefficient with chip and lead frame, poor air tightness, easy to thermal aging or corrosion aging, etc. These weak points would greatly increase the failure rate of LED devices, because of their high heat exchanging efficiency. As expected, during the process of LED device failure analysis, combining with the analysis method of polymer materials, these weak points are proved to be the fundamental reasons of the failure. The failure mechanism including: the electrochemical corrosion of chip and lead frame caused by moisture permeability, chemical corrosion of lead frame and bonding wire and other metallic materials caused by corrosive gas permeation, the corrosion and aging of encapsulant, etc. According to these failure mechanisms, more specific suggestions are offered to increase LED device quality.
  • Keywords
    ageing; corrosion; encapsulation; failure analysis; lead bonding; light emitting diodes; plastic packaging; polymers; semiconductor device packaging; silicones; LED package; bonding wire; corrosion aging; corrosive gas permeation; electrochemical corrosion; encapsulant; epoxy; failure analysis; heat exchanging efficiency; lead frame; moisture permeability; optoelectronic device; plastic packaging materials; polymer materials; poor air tightness; silicone; thermal aging; thermal mismatch coefficient; typical failure mechanism; Bonding; Corrosion; Encapsulation; Failure analysis; Light emitting diodes; Materials; Moisture; LED; Package; corrosion; encapsulant; failure analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
  • Conference_Location
    Chengdu
  • Type

    conf

  • DOI
    10.1109/ICEPT.2014.6922857
  • Filename
    6922857