• DocumentCode
    1188878
  • Title

    A correctness criterion for asynchronous circuit validation and optimization

  • Author

    Gopalakrishnan, Ganesh ; Brunvand, Erik ; Michell, Nick ; Nowick, Steven M.

  • Author_Institution
    Dept. of Comput. Sci., Utah Univ., Salt Lake City, UT, USA
  • Volume
    13
  • Issue
    11
  • fYear
    1994
  • fDate
    11/1/1994 12:00:00 AM
  • Firstpage
    1309
  • Lastpage
    1318
  • Abstract
    In order to reasonably determine the correctness of asynchronous circuit implementations and specifications, Dill (1989) has developed a variant of trace theory. Trace theory describes the behavior of an asynchronous circuit by representing its possible executions as strings, called “traces.” A useful relation defined in this theory is called conformance, which holds when one trace specification can be safely substituted for another. We propose a new relation in the context of Dill´s trace theory, called strong conformance. We show that this relation is capable of detecting certain errors in asynchronous circuits that cannot be detected through conformance. Strong conformance also helps to justify circuit optimization rules where a component is replaced by another component having extra capabilities (e.g., it can accept more inputs). The structural operators of Dill´s trace theory-compose, rename, and hide-are shown to be monotonic with respect to strong conformance. Experiments are presented using a modified version of Dill´s trace theory verifier that implements a check for strong conformance
  • Keywords
    asynchronous sequential logic; circuit analysis computing; delays; error detection; logic testing; sequential circuits; asynchronous circuit; circuit optimization; circuit validation; correctness criterion; error detection; strong conformance; trace theory; Asynchronous circuits; Circuit optimization; Cities and towns; Computer science; Conductors; Delay; Hardware; Modems; Very large scale integration; Wires;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.329261
  • Filename
    329261